Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 16
Analysis of the longitudinal stress component in the grooves. The red (green) squares indicate the uncorrected (corrected) σ_yy values. The Laplace (dotted lines) and real-space (solid lines) depth profiles of the hoop stress component σ_ϕϕ are included for the purpose of classification of the near-surface residual stress state.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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