Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 17
Application of the transverse contraction method to measurement point B. (a) Normalized lattice spacings obtained under ψ = 0 with detector D1 (2θ = 21.5°). (b) Data evaluation according to equation (13). (c) Discrete residual stress depth profile $[\sigma_{\phi\phi} (\tau^{hkl}_{0})]$ evaluated from the D1 data, and averaged in-plane residual stress 〈σ_∥〉 obtained from the slope of the regression line fitted to the data in panel (b). The green shaded areas in panels (a) and (c) mark the reflections that result in an almost homogeneous residual stress depth profile. For further details see the main text.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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