Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 2
Reference systems for XSA on flat and curved surfaces. All coordinate systems are right handed. In the reference systems of the sample (stresses), the y axis points into (out of) the drawing plane. For the sake of clarity, only the normal components are shown in the stress reference systems.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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