Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 5
Diffraction geometry for analysis of the longitudinal stress component σ_yy. (a) Spatial illustration of the beam path and the impact of the stress components σ_ϕϕ and σ_rr. (b) True-to-scale representation of the irradiated surface area in the groove for AD diffraction at the 220 reflection (2θ²²⁰ = 124.4°; Table 1). For the nomenclature, see Fig. 3.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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