Depth-resolved X-ray residual stress analysis on samples with cylindrically shaped surface topography

Klaus, M.; Apel, D.; Boin, M.; Wimpory, R.; Genzel, C.

doi:10.1107/S1600576726007302

Figure 9
X-ray beam spot sizes on the sample (recorded on a fluorescent screen, inserted true to scale) for the initial orientation ψ = 0°. For the AD diffraction mode, the case of the 110 reflection with the smallest Bragg angle is shown, as it leads to the largest extension of the beam spot on the sample.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026|

https://doi.org/10.1107/S1600576726007302

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