Deterministic segmentation of grains in dense Laue microdiffraction datasets

Bongiorno, S.; Micha, J.-S.; Tardif, S.; Eymery, J.

doi:10.1107/S1600576726007995

Figure 1
(a) Schematic of the diffraction geometry used at BM32 (ESRF): A focused white beam (energy range between 5 and 27 keV) illuminates a column of grains along the beam path. Multiple grains satisfy distinct Bragg conditions, and the scattered rays are collected on a 2D sCMOS detector. (b) Typical Laue pattern collected in a raster scan of polycrystalline SiC. The full detector (2018 × 2016 pixels) image exhibits the high spot density typical of polychromatic diffraction from a polycrystalline sample. (c)–(f) Four regions of interest (ROIs 1–4) are enlarged to illustrate local variability across the pattern: differences in spot density and intensity, variations in spot shape (from rounded to streaked or elongated), degrees of overlap, and background level. These contrasts reflect changes in local grain illumination, strain and misorientation within the illuminated volume.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026| Pages 1584-1594

https://doi.org/10.1107/S1600576726007995

Open

access