Deterministic segmentation of grains in dense Laue microdiffraction datasets

Bongiorno, S.; Micha, J.-S.; Tardif, S.; Eymery, J.

doi:10.1107/S1600576726007995

Figure 3
Experimental positions of all diffraction peaks on the sCMOS detector during a 101 × 101 raster scan of a 3C-SiC polycrystalline sample (representative of a 50 µm × 50 µm scan in steps of 0.5 µm in both directions). The positions of all the peaks collected on the detector during the scan are plotted on the leftmost panel. Successive magnifications reveal a specific structure in the data when moving from left to right (all axes are in pixel units). Diffraction spots organize into clusters associated with common families of lattice planes, but they can be heterogeneous in size and partially overlapping. The complexity may prevent a straightforward definition of a single nominal position for each cluster, as indicated by the orange scatter points in the three ROIs. The implications of this ambiguity and how it is dealt with are discussed in Section S5.1 of the supplementary materials.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 59| Part 5| October 2026| Pages 1584-1594

https://doi.org/10.1107/S1600576726007995

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