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Figure 7
Correlations between pairwise SFX patterns, and correlations between SFX patterns and a model with full reflections. The data set is from simulations obtained using the partial_sim program (see Fig. 4[link]). (a) Diffraction patterns are compared with a randomly selected pattern, and correlation coefficients for two indexing modes are calculated for every pair of patterns (black and red). The average coefficients for each indexing mode are shown with blue and yellow lines. (b) Correlations between the diffraction pattern and the merged intensities after three iterations. It is clear that the correlations shown in (b) separate the two indexing modes more reliably, even in the presence of severe partiality (<40%, see Fig. 4[link]a).

IUCrJ
Volume 1| Part 6| September 2014| Pages 393-401
ISSN: 2052-2525
doi:10.1107/S2052252514020314