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Figure 9
Rietveld refinement results for the John Klein mudstone (∼56.5 h integration). The vertical line near 10° 2θ represents the position of a Pearson VII profile used to model the ∼10 Å diffraction peak from a phyllosilicate. The differences near 22° 2θ are due to the 02l diffraction band from the phyllosilicate.

IUCrJ
Volume 1| Part 6| October 2014| Pages 514-522
ISSN: 2052-2525
doi:10.1107/S2052252514021150