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Figure 1
Diffraction patterns of benzil obtained from data recorded at the 11-ID-B beamline of the Advanced Photon Source (APS). (a) A single data frame recorded on a Perkin–Elmer amorphous silicon two-dimensional area detector using 58.26 keV X-rays (λ = 0.2127 Å). (b) The hk0 reciprocal section at 300 K, reconstructed from a data set comprising 740 such frames. (c) The same section recorded at 100 K. The maximum [{\bf q} = 4\pi\sin{\theta/\lambda}] recorded was 8.52 Å−1. Note that the intensities in these images are displayed on a logarithmic scale. Reproduced from Welberry & Goossens (2014BB13).

IUCrJ
Volume 2| Part 4| June 2015| Pages 384-386
ISSN: 2052-2525
doi:10.1107/S2052252515010891