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Figure 1
A sketch of the real-time diffraction topography imaging setup. White radiation from two undulators impinges on a silicon wafer. Both the 220 reflection topograph and the direct transmission image are recorded simultaneously. Both imaging detectors are equipped with a high-speed camera in order to allow for a short exposure time (1.28 µs) and a high image-acquisition rate (∼35 500 images per second).

IUCrJ
Volume 3| Part 2| March 2016| Pages 108-114
ISSN: 2052-2525
doi:10.1107/S205225251502271X