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Figure 4
Laue diffraction pattern recorded at 150 K, ϕ = −30° using the mini-DAC. The pattern is dominated by scattering from the two diamond anvils: A marks the reflection of one anvil; B marks the reflection of the other anvil. Inset C shows four reflections from the sample along the [111] zone, reflection lies on top of a pseudo-Kossel line. Inset D highlights the same pseudo-Kossel line which is centred on the reflection marked by A. The contrast in each inset is adjusted to highlight certain features. |
ISSN: 2052-2525
NEUTRON | SYNCHROTRON
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journal menu![[Figure 4]](fs5125fig4.jpg)
reflection of one anvil; B marks the
reflection of the other anvil. Inset C shows four reflections from the sample along the [111] zone, reflection
lies on top of a pseudo-Kossel line. Inset D highlights the same pseudo-Kossel line which is centred on the reflection marked by A. The contrast in each inset is adjusted to highlight certain features.


