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Figure 2
(a) X-ray diffuse scattering from sample A at 300 K in the (hk0) plane; the same diffuse scattering pattern is observed for sample B. (b) The (422) reflection at 20 K for sample A, collected with the image plate on beamline BL02B1. (c) The (422) reflection at 20 K for sample B on the same intensity scale as in part (b), collected with the image plate on BL02B1. (d) The FWHM of the (204) reflection plotted as a function of temperature from powder X-ray diffraction (PXRD) (sample B) derived from conventional data measured on a Rigaku SmartLab diffractometer. At 500 K an increase in the FWHM reflects the formation of multiple peaks and asymmetries, as discussed in Section 3.2[link].

IUCrJ
Volume 3| Part 5| September 2016| Pages 377-388
ISSN: 2052-2525
doi:10.1107/S2052252516012707