Classification of crystal structure using a convolutional neural network

Park, W.B.; Chung, J.; Jung, J.; Sohn, K.; Singh, S.P.; Pyo, M.; Shin, N.; Sohn, K.-S.

doi:10.1107/S205225251700714X

Figure 4
XRD patterns for Ca_1.5Ba_0.5Si₅N₆O₃ (S-1) and BaAlSi₄O₃N₅:Eu²⁺ system (S-2), along with the Rietveld refinement fits. The black dots, red lines, blue lines and vertical tick marks represent the experimental, calculated, difference profile and peak positions, respectively. The vertical tick marks in the second and third rows represent the peak positions corresponding to impurity phases.

IUCrJ

Volume 4| Part 4| July 2017| Pages 486-494

ISSN: 2052-2525

https://doi.org/10.1107/S205225251700714X

MATERIALS | COMPUTATION

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