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Figure 4
XRD patterns for Ca1.5Ba0.5Si5N6O3 (S-1) and BaAlSi4O3N5:Eu2+ system (S-2), along with the Rietveld refinement fits. The black dots, red lines, blue lines and vertical tick marks represent the experimental, calculated, difference profile and peak positions, respectively. The vertical tick marks in the second and third rows represent the peak positions corresponding to impurity phases. |
ISSN: 2052-2525
MATERIALS | COMPUTATION
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