Figure 7
The experimental reduction in scattering-factor error measurement (Rsplit) with increasing number N of diffraction patterns follows a Poisson error law Rsplit = k/N1/2. For this SFX analysis of the photosystem II complex (PDB entry 3wu2) k = 18.5. Progress in SFX algorithm development, partial reflection analysis and scaling is measured by the reduction in k in recent years. |