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Figure 7
The experimental reduction in scattering-factor error measurement (Rsplit) with increasing number N of diffraction patterns follows a Poisson error law Rsplit = k/N1/2. For this SFX analysis of the photosystem II complex (PDB entry 3wu2) k = 18.5. Progress in SFX algorithm development, partial reflection analysis and scaling is measured by the reduction in k in recent years.

Volume 4| Part 4| July 2017| Pages 322-339
ISSN: 2052-2525