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Figure 2
(a) Raw diffraction intensities for the thin-film sample including the substrate and for the substrate itself. (b) Diffraction intensities for the thin film only from four independent measurements. The 10 min runs were scaled to compare with the 30 min run. (c) The scattering signals for a-IMC from the tube (blue) and the thin-film (red) methods. The thin-film signal was scaled to match the signal from the tube method.

IUCrJ
Volume 4| Part 5| September 2017| Pages 555-559
ISSN: 2052-2525
https://doi.org/10.1107/S2052252517009344