Merging single-shot XFEL diffraction data from inorganic nanoparticles: a new approach to size and orientation determination

Li, X.; Spence, J.C.H.; Hogue, B.G.; Liu, H.

doi:10.1107/S2052252517012398

Figure 2
Angular profile conversion. The average intensity profile as a function of azimuth angle (right) is extracted from the raw pattern (left) (two sectors are plotted to show the region of integration at angle ψ).

IUCrJ

Volume 4| Part 6| November 2017| Pages 741-750

ISSN: 2052-2525

https://doi.org/10.1107/S2052252517012398

PHYSICS | FELS

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