Analysis of XFEL serial diffraction data from individual crystalline fibrils

Wojtas, D.H.; Ayyer, K.; Liang, M.; Mossou, E.; Romoli, F.; Seuring, C.; Beyerlein, K.R.; Bean, R.J.; Morgan, A.J.; Oberthuer, D.; Fleckenstein, H.; Heymann, M.; Gati, C.; Yefanov, O.; Barthelmess, M.; Ornithopoulou, E.; Galli, L.; Xavier, P.L.; Ling, W.L.; Frank, M.; Yoon, C.H.; White, T.A.; Bajt, S.; Mitraki, A.; Boutet, S.; Aquila, A.; Barty, A.; Forsyth, V.T.; Chapman, H.N.; Millane, R.P.

doi:10.1107/S2052252517014324

Figure 4
Averaged diffraction patterns (a) in detector space and (b) mapped into cylindrically averaged reciprocal space, using a tilt of 10° for each pattern. (c) Averaged diffraction pattern in reciprocal space after re-orientating each pattern in φ and β as described in the text. The arrows in panels (b) and (c) show the equatorial reflection used to evaluate the orientation, as described in Section 4.4

IUCrJ

Volume 4| Part 6| November 2017| Pages 795-811

ISSN: 2052-2525

https://doi.org/10.1107/S2052252517014324

PHYSICS | FELS

Open

access

Follow IUCrJ

Search IUCr Journals		doi		Advanced search
Author		volume	page