Analysis of XFEL serial diffraction data from individual crystalline fibrils

Wojtas, D.H.; Ayyer, K.; Liang, M.; Mossou, E.; Romoli, F.; Seuring, C.; Beyerlein, K.R.; Bean, R.J.; Morgan, A.J.; Oberthuer, D.; Fleckenstein, H.; Heymann, M.; Gati, C.; Yefanov, O.; Barthelmess, M.; Ornithopoulou, E.; Galli, L.; Xavier, P.L.; Ling, W.L.; Frank, M.; Yoon, C.H.; White, T.A.; Bajt, S.; Mitraki, A.; Boutet, S.; Aquila, A.; Barty, A.; Forsyth, V.T.; Chapman, H.N.; Millane, R.P.

doi:10.1107/S2052252517014324

Figure 5
Angular profiles of an equatorial reflection (blue) and the strong reflection on the first layer line (red) in the averaged diffraction pattern shown in Fig. 4

(b). Also shown are the angular profiles of the same equatorial (black) and first layer line (green) reflections after reorienting and averaging the diffraction patterns (Fig. 4

c).

IUCrJ

Volume 4| Part 6| November 2017| Pages 795-811

ISSN: 2052-2525

https://doi.org/10.1107/S2052252517014324

PHYSICS | FELS

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