Electron crystallography with the EIGER detector

Tinti, G.; Fröjdh, E.; van Genderen, E.; Gruene, T.; Schmitt, B.; de Winter, D. A. M.; Weckhuysen, B. M.; Abrahams, J. P.

doi:10.1107/S2052252518000945

Figure 7
(a) Simulation of the number of detected events as a function of threshold for 200 keV electrons. (b) Simulation of the mean position error as a function of threshold for 200 keV electrons.

IUCrJ

Volume 5| Part 2| March 2018| Pages 190-199

ISSN: 2052-2525

https://doi.org/10.1107/S2052252518000945

NEUTRON | SYNCHROTRON

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