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Figure 2
(a) Image of the primary beam on the FReLoN camera acquired with 2 s exposure time. The beam was attenuated by stacking a 500 µm thick Cu foil and a 500 µm thick GaAs wafer to avoid saturation. (b) Corresponding image of the diffracted beam. No attenuator was placed in the diffracted beam path. (c) Blurred version of the image in (a) to highlight the similarities in the speckle pattern distribution between the direct and the diffracted beam.

IUCrJ
Volume 5| Part 4| July 2018| Pages 428-438
ISSN: 2052-2525
https://doi.org/10.1107/S205225251800711X