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Figure 1
The experimental setup for stroboscopic high-resolution reciprocal space mapping. (a) As-grown and prepared sample, with the crystallographic orientation of the edges shown. (b) A view of the sample holder for application of the electric field. (c) A flow chart of the stroboscopic data-acquisition process. The diffracted signal is collected using a single-photon-counting APD detector placed behind an Si(111) analyser crystal in ω versus 2θ scan mode. A cyclic 100 Hz triangular-shaped electric field is applied to the sample. Detector signals are processed using a custom-built stroboscopic data-acquisition system.

Volume 5| Part 4| July 2018| Pages 417-427
ISSN: 2052-2525