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Figure 2
Schematic of the experimental setup in the Bauhaus chamber at FLASH. The X-ray-pulse trains pass through the in-line microscope into the interaction region. The nozzle is positioned so that the emerging jet intercepts the X-rays. The diffraction signal generated by the interaction between the jet and the X-ray beam is recorded by the Princeton PI-MTE detector and the effects of this interaction on the jet are monitored with a bright field microscope setup. Here, pulses from a fiber-coupled diode laser (DILAS) illuminate the jet and the image is formed with an in-vacuum microscope objective and a fast camera (Photron SA-4) located outside the vacuum chamber.

Volume 5| Part 5| September 2018| Pages 574-584
ISSN: 2052-2525