Rapid sample delivery for megahertz serial crystallography at X-ray FELs

Wiedorn, M.O.; Awel, S.; Morgan, A.J.; Ayyer, K.; Gevorkov, Y.; Fleckenstein, H.; Roth, N.; Adriano, L.; Bean, R.; Beyerlein, K.R.; Chen, J.; Coe, J.; Cruz-Mazo, F.; Ekeberg, T.; Graceffa, R.; Heymann, M.; Horke, D.A.; Knoška, J.; Mariani, V.; Nazari, R.; Oberthür, D.; Samanta, A.K.; Sierra, R.G.; Stan, C.A.; Yefanov, O.; Rompotis, D.; Correa, J.; Erk, B.; Treusch, R.; Schulz, J.; Hogue, B.G.; Gañán-Calvo, A.M.; Fromme, P.; Küpper, J.; Rode, A.V.; Bajt, S.; Kirian, R.A.; Chapman, H.N.

doi:10.1107/S2052252518008369

Figure 7
Hit fraction for different numbers of X-ray pulses in each pulse train. The error bars are derived from the standard deviation of hit fractions from many data collection runs under similar conditions. The dashed line is a linear fit.

IUCrJ

Volume 5| Part 5| September 2018| Pages 574-584

ISSN: 2052-2525

https://doi.org/10.1107/S2052252518008369

PHYSICS | FELS

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