Single-particle imaging without symmetry constraints at an X-ray free-electron laser

Rose, M.; Bobkov, S.; Ayyer, K.; Kurta, R.P.; Dzhigaev, D.; Kim, Y.Y.; Morgan, A.J.; Yoon, C.H.; Westphal, D.; Bielecki, J.; Sellberg, J.A.; Williams, G.; Maia, F.R.N.C.; Yefanov, O.M.; Ilyin, V.; Mancuso, A.P.; Chapman, H.N.; Hogue, B.G.; Aquila, A.; Barty, A.; Vartanyants, I.A.

doi:10.1107/S205225251801120X

Figure 3
Projection of feature vectors onto the PCA plane. Each dot corresponds to a diffraction pattern. The green empty dots represent diffractions patterns of Set_44k and the yellow dots represent single hits of Set_14k. The manually classified patterns are marked by red (single hits) and blue dots (multiple hits).

IUCrJ

Volume 5| Part 6| November 2018| Pages 727-736

ISSN: 2052-2525

https://doi.org/10.1107/S205225251801120X

PHYSICS | FELS

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