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Figure 6
(a) High-resolution electron microscopy image of PCN and the fast Fourier transform patterns of the marked region as an inset. (b) The inverse Fourier transform of the inset image in (a) where only the superlattice reflections are included.

IUCrJ
Volume 5| Part 6| November 2018| Pages 808-815
ISSN: 2052-2525
https://doi.org/10.1107/S2052252518013805