SAED patterns simulated using JEMS (Stadelmann, 2012) for (a) a γ-Al2O3 nanocrystallite with idealized crystal structure, (b) with conservative APBs , (c) with non-conservative APBs , (d) with rotational boundaries that resemble non-conservative APBs, (e) with non-conservative APBs and (f) with conservative APBs and . These SAED patterns correspond to the defect types shown in Fig. 3. (g) The experimental SAED pattern once more for comparison. (h) The intensity profiles of the reflections 113 and 220 calculated using DIFFaX (Treacy et al., 1991) for non-conservative APBs with a probability of 10%.