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Figure 5
Fitting of the calculated to the experimental XRPD pattern after Rietveld refinement. Calculated (blue), observed (red) and difference (black) profiles are shown. Tick marks, indicating the calculated positions of the diffraction peaks, are shown at the bottom of the profile. The range above 25° 2θ was expanded by a factor of 13.

IUCrJ
Volume 6| Part 1| January 2019| Pages 136-144
ISSN: 2052-2525
https://doi.org/10.1107/S205225251801686X