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Figure 1
Schematic illustration of the grazing-incidence geometry (all optical components from the undulator source up to the pinhole in front of the sample have been omitted for clarity). In the inset drawing, the beam height h, the fixed incidence angle α and the varying diffraction angle 2θ are defined. In the 2D diffraction pattern, the so-called sample horizon divides the image into an upper and a lower half. In the lower half, the intensities are less than in the upper part as the diffracted signal is partly absorbed by the substrate it passes on its way to the detector, whereas the upward scattering reaches the detector unattenuated.

IUCrJ
Volume 6| Part 2| March 2019| Pages 290-298
ISSN: 2052-2525
https://doi.org/10.1107/S2052252519000514