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Figure 12
(a) The scattering from lamellar stacks with θi = 0–1°. The scattering of the lamellar stack with θi = 0 is induced by the evanescent waves, while the scattering from the lamellar stacks with θi = 0.034–1° is induced directly by the incident X-rays. (b) The overall scattering induced by the incident X-ray beam and the evanescent waves, respectively, in a spherulite with a lamellar lateral size of 250 nm. (c) The overall scattering from a lamellar system with infinite lateral size. (d) The Fourier transform result for the scattering in panel (c).

Volume 6| Part 5| September 2019| Pages 968-983
ISSN: 2052-2525