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Figure 4
(a) Tensile stress–strain curves of the Ni43.7Cu1.5Co5.1Mn36.7In13 microwire, measured up to different strain levels at room temperature. The symbol (×) represents the point of fracture. The upper right inset shows a fractograph after the tensile test. (b) An EBSD orientation map of the tested microwire. This map is presented in inverse pole-figure mode; the legend (parallel to AD) is also displayed in the figure. AD denotes the axial direction of the microwire. (c) Tensile stress–strain curves measured at different temperatures from 253 to 313 K. (d) The temperature dependence of the nucleation stress and propagation stress.

Volume 6| Part 5| September 2019| Pages 843-853
ISSN: 2052-2525