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Figure 10
The temperature dependence for resistance of Bi thin films at thicknesses of (a) 19 nm, (b) 24 nm, (c) 29 nm and (d) 33 nm. The red line represents the e-index fitting, the green line represents the line fitting and the blue line represents two-transport channels fitting. Furthermore, (e)–(g) are the feature transition temperature points extracted from (a)–(d) and represent transition temperature as a function of sample thickness. (e) The deviation metal-surface-states point (green solid symbols), (f) the deviation semiconductor-bulk-states point (red solid symbols) and (g) the metal-surface-states transition temperature Ttop corresponding to the maximum resistance in the metal and bulk states competition.

IUCrJ
Volume 7| Part 1| January 2020| Pages 49-57
ISSN: 2052-2525
https://doi.org/10.1107/S2052252519015458