Investigation of growth characteristics and semimetal–semiconductor transition of polycrystalline bis­muth thin films

Wang, N.; Dai, Y.-X.; Wang, T.-L.; Yang, H.-Z.; Qi, Y.

doi:10.1107/S2052252519015458

Figure 3
The FWHM and out-of-plane grain size as a function of Bi thin films for substrate temperatures (the growth rate is 1.61 Å min⁻¹ and the deposition time is 240 min).

IUCrJ

Volume 7| Part 1| January 2020| Pages 49-57

ISSN: 2052-2525

https://doi.org/10.1107/S2052252519015458

CHEMISTRY | CRYSTENG

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