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Figure 8
XRD patterns of Bi thin films with different growth rates at 0.14, 0.19, 0.47 and 1.61 Å min
−1
(the thickness is 30 nm, the substrate temperature is 70°C and
T
s
/
T
m
= 0.63)
IUCrJ
Volume 7
|
Part 1
|
January 2020
|
Pages 49-57
ISSN: 2052-2525
https://doi.org/10.1107/S2052252519015458
CHEMISTRY
|
CRYSTENG
Open
access
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.