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Figure 4
(a) PXRD patterns of arc-melt Co2−xRuxMnSi (x = 0, 0.25, 0.50, 0.75, 1.00) ingots. (b) PXRD patterns of arc-melt Co2−xRuxMnSi (x = 0, 0.25, 0.50, 0.75 and 1.00) ingots annealed at 1173 K for 2 days. (c) SEM image of the metallographic specimen of the arc-melt Co1.25Ru0.75MnSi.

IUCrJ
Volume 7| Part 1| January 2020| Pages 113-120
ISSN: 2052-2525