Synthesis, structure, magnetic and half-metallic properties of Co2−xRuxMnSi (x = 0, 0.25, 0.5, 0.75, 1) compounds

Zhang, H.P.; Liu, W.B.; Dai, X.F.; Zhang, X.M.; Liu, H.Y.; Yu, X.; Liu, G.D.

doi:10.1107/S2052252519015641

Figure 7
(a) Local magnification of the T-plot at low temperature with inserts that are the curves of resistance with temperature for Co_2−xRu_xMnSi (x = 0, 0.25, 0.5, 0.75, 1) compounds. (b) T³-plot of the resistance R(T) at low temperature for all the Co_2−xRu_xMnSi (x = 0, 0.25, 0.5, 0.75, 1) compounds.

IUCrJ

Volume 7| Part 1| January 2020| Pages 113-120

ISSN: 2052-2525

https://doi.org/10.1107/S2052252519015641

MATERIALS | COMPUTATION

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