Refinement for single-nanoparticle structure determination from low-quality single-shot coherent diffraction data

Nishiyama, T.; Niozu, A.; Bostedt, C.; Ferguson, K.R.; Sato, Y.; Hutchison, C.; Nagaya, K.; Fukuzawa, H.; Motomura, K.; Wada, S.; Sakai, T.; Matsunami, K.; Matsuda, K.; Tachibana, T.; Ito, Y.; Xu, W.; Mondal, S.; Umemoto, T.; Nicolas, C.; Miron, C.; Kameshima, T.; Joti, Y.; Tono, K.; Hatsui, T.; Yabashi, M.; Ueda, K.

doi:10.1107/S2052252519014222

Figure 1
Measured diffraction patterns from Xe clusters. (a) A concentric ring pattern suggesting a spherical cluster. (b) The 1D scattering intensity deduced from the pattern (a) and a fitting curve. (c) A pattern consisting of concentric rings with aperiodic intensity modulation suggests existence of a cluster having surface structures. (d) The 1D scattering intensity deduced from the pattern (c) and a fitting curve. The scale bars in (a) and (c) are 0.1 nm⁻¹.

IUCrJ

Volume 7| Part 1| January 2020| Pages 10-17

ISSN: 2052-2525

https://doi.org/10.1107/S2052252519014222

PHYSICS | FELS

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