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Figure 3
Diffraction patterns simulated from the electron density shown in Fig. 2[link](a). The top row represents the highest incident XFEL fluence case and the fluence is reduced as it moves to the bottom. The first column shows the diffraction patterns without missing regions and the missing region becomes larger as it moves to the right. The current experimental condition corresponds to the middle one (e). The scale bars are 0.1 nm−1.

ISSN: 2052-2525