Refinement for single-nanoparticle structure determination from low-quality single-shot coherent diffraction data

Nishiyama, T.; Niozu, A.; Bostedt, C.; Ferguson, K.R.; Sato, Y.; Hutchison, C.; Nagaya, K.; Fukuzawa, H.; Motomura, K.; Wada, S.; Sakai, T.; Matsunami, K.; Matsuda, K.; Tachibana, T.; Ito, Y.; Xu, W.; Mondal, S.; Umemoto, T.; Nicolas, C.; Miron, C.; Kameshima, T.; Joti, Y.; Tono, K.; Hatsui, T.; Yabashi, M.; Ueda, K.

doi:10.1107/S2052252519014222

Figure 3
Diffraction patterns simulated from the electron density shown in Fig. 2

(a). The top row represents the highest incident XFEL fluence case and the fluence is reduced as it moves to the bottom. The first column shows the diffraction patterns without missing regions and the missing region becomes larger as it moves to the right. The current experimental condition corresponds to the middle one (e). The scale bars are 0.1 nm⁻¹.

IUCrJ

Volume 7| Part 1| January 2020| Pages 10-17

ISSN: 2052-2525

https://doi.org/10.1107/S2052252519014222

PHYSICS | FELS

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