Refinement for single-nanoparticle structure determination from low-quality single-shot coherent diffraction data

Nishiyama, T.; Niozu, A.; Bostedt, C.; Ferguson, K.R.; Sato, Y.; Hutchison, C.; Nagaya, K.; Fukuzawa, H.; Motomura, K.; Wada, S.; Sakai, T.; Matsunami, K.; Matsuda, K.; Tachibana, T.; Ito, Y.; Xu, W.; Mondal, S.; Umemoto, T.; Nicolas, C.; Miron, C.; Kameshima, T.; Joti, Y.; Tono, K.; Hatsui, T.; Yabashi, M.; Ueda, K.

doi:10.1107/S2052252519014222

Figure 4
Electron density reconstructed from the simulation data using the present method. Each figure represents the reconstructed structure obtained from the corresponding diffraction pattern in Fig. 3

. The scale bars are 100 nm.

IUCrJ

Volume 7| Part 1| January 2020| Pages 10-17

ISSN: 2052-2525

https://doi.org/10.1107/S2052252519014222

PHYSICS | FELS

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