Refinement for single-nanoparticle structure determination from low-quality single-shot coherent diffraction data

Nishiyama, T.; Niozu, A.; Bostedt, C.; Ferguson, K.R.; Sato, Y.; Hutchison, C.; Nagaya, K.; Fukuzawa, H.; Motomura, K.; Wada, S.; Sakai, T.; Matsunami, K.; Matsuda, K.; Tachibana, T.; Ito, Y.; Xu, W.; Mondal, S.; Umemoto, T.; Nicolas, C.; Miron, C.; Kameshima, T.; Joti, Y.; Tono, K.; Hatsui, T.; Yabashi, M.; Ueda, K.

doi:10.1107/S2052252519014222

Figure 6
Result of the structure reconstruction from the measured diffraction pattern [Fig. 1

(c)] using the implemented algorithm. (a) A projection of a uniform dense sphere used as the initial estimate of the density map. (b) The reconstructed density map by the implemented algorithm. (c) The difference between (a) and (b) defined as (b) − (a). (d) The simulated pattern from (a). (e) The simulated pattern from (b). The scale bars in (a)–(c) are 100 nm and those in (d)–(e) are 0.1 nm⁻¹.

IUCrJ

Volume 7| Part 1| January 2020| Pages 10-17

ISSN: 2052-2525

https://doi.org/10.1107/S2052252519014222

PHYSICS | FELS

Open

access

Follow IUCrJ

Search IUCr Journals		doi		Advanced search
Author		volume	page