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Figure 3
Areas of chips measured for REP24 at (a) in-vacuum at CXI and (b) in humidified He at MFX, represented by the median-intensity heat maps below. Heat maps of median scattered intensity overlaid with contour plots of hit rate averaged spatially over a 250 µm radius for (c) the enclosed REP24 sample at CXI, (d) the REP24 sample at MFX and (e) the thin-film/PMMA-FLG sample at CXI.

IUCrJ
Volume 7| Part 1| January 2020| Pages 30-41
ISSN: 2052-2525
https://doi.org/10.1107/S2052252519014003