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Figure 1
(a) A cryo-TEM grid held on a tweezer pin. (b) A cryo-TEM grid viewed in the on-axis viewing microscope overlaid with the coordinate system used to identify crystals in the scanning electron microscope (SEM) post X-ray exposure. (c) SEM image of HEWL crystal dimensions being determined.

IUCrJ
Volume 7| Part 1| January 2020| Pages 129-135
ISSN: 2052-2525
https://doi.org/10.1107/S2052252519016178