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Figure 7
Comparison of experimental and simulated (px = 0.225, py = 0.05) electron diffraction patterns of zones (a) and (b) [010], and (c) and (d) [110]. Intensity profiles taken along the corresponding diffraction lines are marked in (a) and (b) by red rectangles. Plot of experimental (black circles) and the simulated (red) line profiles (e) 20l and (f) 60l for the stacking probabilities px = 0.20 and px = 0.25, respectively. Plot of the integrated absolute difference between simulated and experimental line profiles against the stacking probability of layer β for line profiles (e) 20l and (f) 60l. Blue trend lines were fitted by a polynomial degree of six.

IUCrJ
Volume 7| Part 3| May 2020| Pages 522-534
ISSN: 2052-2525
https://doi.org/10.1107/S2052252520003991