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Figure 4
Estimation of electron exposure in NanoEDT. The top gradient represents increasing exposure to the incident electron beam. Several cryoEM methods are highlighted with typical values of exposure. The blue dot indicates the apparent exposure of the NanoEDT structure based on comparison with observed B factors in structures solved by MicroED at a known electron exposure. The blue mesh represents the 2FoFc map (contoured at 1σ).

Volume 7| Part 3| May 2020| Pages 490-499
ISSN: 2052-2525