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Figure 4
Estimation of electron exposure in NanoEDT. The top gradient represents increasing exposure to the incident electron beam. Several cryoEM methods are highlighted with typical values of exposure. The blue dot indicates the apparent exposure of the NanoEDT structure based on comparison with observed B factors in structures solved by MicroED at a known electron exposure. The blue mesh represents the 2Fo − Fc map (contoured at 1σ).

IUCrJ
Volume 7| Part 3| May 2020| Pages 490-499
ISSN: 2052-2525
https://doi.org/10.1107/S2052252520004030