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Figure 2
Schematic illustration of how compressive stress and doming may be generated during plunge-cooling of cryo-EM samples. (a) The sample and foil have cooled to Tg and the foil is under tensile stress between the warmer grid bars. (b) The sample, foil and grid have reached the final temperature Tcryo; tensile stress in the foil associated with the transient temperature difference between the grid and foil has been released, and the sample is now under compression. (c) After receiving an electron dose D, radiation-induced creep in the presence of compressive stress has produced doming of the sample within the holes in the foil.

IUCrJ
Volume 7| Part 3| May 2020| Pages 416-421
ISSN: 2052-2525
https://doi.org/10.1107/S2052252520002560