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Figure 5
In situ
thin-film NI-PDF and resistivity measured simultaneously for the as-deposited films: (left) ZS2 and (right) ZS3_373K. PDF patterns at selected surface temperatures are shown in Figs. S16 and S17.
IUCrJ
Volume 8
|
Part 3
|
May 2021
|
Pages 444-454
ISSN: 2052-2525
https://doi.org/10.1107/S2052252521002852
MATERIALS
|
COMPUTATION
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The IUCr is a scientific union serving the interests of crystallographers and other scientists employing crystallographic methods.