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Figure 1
Rietveld analysis results of the total-scattering data of Si at 100 K obtained using OHGI. Black dots, red lines and blue lines show the data points, the calculated pattern and the difference, respectively.

IUCrJ
Volume 8| Part 3| May 2021| Pages 387-394
ISSN: 2052-2525
https://doi.org/10.1107/S2052252521001664
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