Figure 3
FWHM of Si at 100 K. The blue stars show experimental FWHM from single-peak fitting using a generic pseudo-Voigt function. The black line shows the FWHM function obtained from the refined TCH parameters in Rietveld analysis of the Si 300 K data. The red dashed line shows a least-squares fit to the TCH FHWM using the function . The refined values of ΓQ0 and κ are shown alongside the refined TCH peak-profile parameters U, V, W, Z, X and Y. |