UnitCell Tools, a package to determine unit-cell parameters from a single electron diffraction pattern

Shi, H.L.; Li, Z.A.

doi:10.1107/S2052252521007867

Figure 3
Effect of pattern distortions on unit-cell determination. (a) Typical $[[{\bar 1\bar 11}]]$ -oriented diffraction pattern with HOLZ reflections of a silicon specimen. The red dashed circle marks the FOLZ ring used for measuring the reciprocal layer spacing H^*. (b) Angle-dependent measured parameters OA₁, OB₁ and OC₁ were extracted from 24 HOLZ reflections, and the dotted curves are the sine-function fitted curves. (c) Determined unit cells by using sets of angularly measured OA₁, OB₁ and OC₁. Where the open symbols in Figs. 3