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Figure 2
Structural information for the three samples A, B and C. Cyan points: scattered intensity Iexp(q), black dashed lines: form factor, red lines: I(q) fitted with Equation (8)[link]. For clarity, the curves are multiplied by a factor. On the right-hand side, single-shot speckle patterns from the three samples are reported. In order to highlight the speckles, a median filter has been applied to the images. The AGIPD is not optimized for SAXS-XPCS experiments, due to the presence of large gaps between the modules and the necessity to mask large areas of the detector. Nevertheless, it is still possible to obtain high-quality data owing to the high repetition rate of this device. The black bar in the pattern (A) indicates a distance of 0.5 nm−1 in the scattering plane.

IUCrJ
Volume 8| Part 5| September 2021| Pages 775-783
ISSN: 2052-2525
https://doi.org/10.1107/S2052252521006333